Nikon N-SIM super-resolution microscope
Super-resolution microscope of the structured illumination type that doubles the resolution of conventional, diffraction limited microscopes by a factor of two. 2D and 3D imaging with excitation wavelength of 405, 488, 561 and 640nm.
The Nikon N-SIM structured illumination microscope on a Nikon Ti inverted microscope is equipped with 4 lasers (405, 488, 561, 640nm), covering a wide range of fluorescent dyes.
The Nikon N-SIM approximately doubles the resolution of conventional optical microscopes (to around 100nm lateral and 200nm axial) by combining the "structured illumination microscopy" technology licensed from UCSF. The system allows a time-resolution of 1.66 frames/s.
The structured illumination microscopy technology was developed by Dr. Mats G. L. Gustafsson, Dr. John W. Sedat and Dr. David A. Agard of UCSF.
The N-SIM is equipped with a Nikon Perfect Focus System (PFS), a device that continuously measures the distance to the coverslip, readjusting it if required, for instance due to changes because of thermal drift. Long-term experiments are strongly faciliated by this. A Tokai Hit on-stage incubation chamber is available.
- Nikon Apo TIRF 100x NA 1.49 oil immersion objective, working distance 0.12mm. A correction collar allows the objective to be accommodated to coverslips with thickness between 0.13 and 0.20mm.
- Nikon CFI Plan Apo IR 60x WI (NA 1.27, WD 0.16 - 0.18mm) water immersion
- Andor iXon3 DU-897E single photon detection EMCCD camera. This camera offers a resolution of 512 x 512 pixels with a gigantic on-chip pixel size of 16 x 16µm and a pixel well capacity of 160,000 electrons. The chip is cooled down to -100°C and 35 full frames can be read out per second.
Bearbeiter: Christian Ackermann
Latest Revision: 2013-10-09